The atomic structure of the Si(111) reconstruction

Levermann, A. H., Howes, P .B., Edwards, K. A., Anyele, H. T., Matthai, Clarence, MacDonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692, Feidenhans'l, R., Lottermoser, L., Seehofer, L., Falkenberg, G. and Johnson, R. L. 1996. The atomic structure of the Si(111) reconstruction. Applied Surface Science 104-05 , pp. 124-129. 10.1016/S0169-4332(96)00132-8

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Abstract

We have studied the atomic structure of the View the MathML source reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(111) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	Elsevier
ISSN:	0169-4332
Last Modified:	24 Oct 2022 10:48
URI:	https://orca.cardiff.ac.uk/id/eprint/45960

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