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(S)TEM Characterisation of InAs/MgO/Co Multilayers

Eustace, D. A., McComb, D. W., Buckle, L., Buckle, Philip Derek, Ashley, T., Singh, L. J., Barber, Z. H., Gilbertson, A. M., Branford, W. R., Clowes, S. K. and Cohen, L. F. 2008. (S)TEM Characterisation of InAs/MgO/Co Multilayers. Presented at: Microscopy of semiconducting materials, 15th Conference, Cambridge, UK, 2-5 April 2007. Proceedings of the 15th Conference on Microscopy of Semiconducting Materials, Cambridge, UK, 2-5 April 2007. Springer Proceedings in Physics , vol. 120. Dordrecht: Springer Verlag, pp. 153-156. 10.1007/978-1-4020-8615-1_32

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The structural integrity, composition and interface quality of tunnel barriers in hybrid ferromagnet-semiconductor structures will have a significant effect on the properties of spintronic devices. We present the results of a study of an amorphous MgO tunnel barrier in a Co/MgO/InAs multilayer structure. Optimum growth parameters for MgO and surface treatment of InAs have been identified by a systematic electron microscopy investigation. Electron energy loss spectroscopy has been used to obtain information on composition and interface quality in the multilayer structures.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: Springer Verlag
ISBN: 9781402086151
ISSN: 0930-8989
Last Modified: 04 Jun 2017 03:12

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