Characterization-oriented design of a compact GaAs MMIC 3-stacked power cell

Ramella, Chiara, Piacibello, Anna, Camarchia, Vittorio, Pirola, Marco and Quaglia, Roberto ORCID: https://orcid.org/0000-0003-3228-301X 2016. Characterization-oriented design of a compact GaAs MMIC 3-stacked power cell. Presented at: Microwave, Radar and Wireless Communications (MIKON), 2016 21st International Conference on, Krakow, Poland, 9-11 May 2016. Microwave, Radar andWireless Communications (MIKON), 2016 21st International Conference on. IEEE, 10.1109/MIKON.2016.7491950

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Abstract

This work discusses the design of a 3-stacked GaAs HEMT test cell at 10 GHz. The series stacked topology, well known for CMOS amplifiers, can be profitably applied to GaAs microwave monolithic integrated circuits, overcoming the limits imposed by breakdown. The stacked structure here presented, currently under fabrication, has been developed following a characterization-oriented strategy, since it aims to assess a commercial high-frequency 0.1 µm AlGaAs HEMT technology through large-signal source- and load-pull characterization. The standard foundry HEMT layout has been modified to obtain a maximally compact cell and reduce transmission lines parasitic effects, thus the foundry model validity in this condition must be assessed, too. For testing purposes a relatively low operating frequency, with respect to the selected technology, has been chosen to reduce the HEMT parasitic effects. When closed on the optimum load, the cell performance at 10 GHz are output power above 27 dBm, PAE around 46% and gain above 17 dB.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	Q Science > Q Science (General)
Uncontrolled Keywords:	Logic gates, Power generation, Gain, HEMTs, Capacitance, Load modeling, Gallium arsenide
Publisher:	IEEE
ISBN:	978-1-5090-2214-4
Last Modified:	02 Nov 2022 11:48
URI:	https://orca.cardiff.ac.uk/id/eprint/103133

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