Cluster cleaned HOPG by XPS

Morgan, David ORCID: https://orcid.org/0000-0002-6571-5731 2017. Cluster cleaned HOPG by XPS. Surface Science Spectra 24 (2) , 024003. 10.1116/1.4993771

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Abstract

X-ray photoelectron spectroscopy (XPS) was used to characterize a highly oriented pyrolytic graphite (HOPG) sample. The HOPG was freshly cleaved using scotch tape prior in the entry lock of the spectrometer and subsequently cleaned using an argon cluster source. This method of cleaning has led to an improved definition of the C(KLL) Auger signal used for differentiation in the determination of sp2/sp3 ratios according to the method of Lascovich et al.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Cardiff Catalysis Institute (CCI) Chemistry
Publisher:	AIP Publishing
ISSN:	1055-5269
Date of First Compliant Deposit:	7 November 2017
Date of Acceptance:	11 September 2017
Last Modified:	05 May 2023 19:00
URI:	https://orca.cardiff.ac.uk/id/eprint/106296

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