Imaging XPS for industrial applications

Morgan, David J. ORCID: https://orcid.org/0000-0002-6571-5731 2019. Imaging XPS for industrial applications. Journal of Electron Spectroscopy and Related Phenomena 231 , pp. 109-117. 10.1016/j.elspec.2017.12.008

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Abstract

Imaging XPS has been available on commercial XPS instruments since the 1990’s, however its exploitation in the elucidation of surface chemistry has been minimal due to historical limitations in spatial resolution and acquisition times. Major developments in both instrumentation and multivariate data analysis techniques have improved greatly on all these aspects and herein a range of imaging analysis to illustrate the power of XPS imaging to a diverse range of industrial sectors is presented.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Cardiff Catalysis Institute (CCI) Chemistry
Publisher:	Elsevier
ISSN:	0368-2048
Date of First Compliant Deposit:	2 January 2018
Date of Acceptance:	20 November 2017
Last Modified:	21 Nov 2024 19:45
URI:	https://orca.cardiff.ac.uk/id/eprint/107824

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