XPS guide: Charge neutralization and binding energy referencing for insulating samples

Baer, Donald R., Artyushkova, Kateryna, Cohen, Hagai, Easton, Christopher D., Engelhard, Mark, Gengenbach, Thomas R., Greczynski, Grzegorz, Mack, Paul, Morgan, David J. ORCID: https://orcid.org/0000-0002-6571-5731 and Roberts, Adam 2020. XPS guide: Charge neutralization and binding energy referencing for insulating samples. Journal of Vacuum Science and Technology A 38 (3) , 031204. 10.1116/6.0000057

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Abstract

This guide deals with methods to control surface charging during XPS analysis of insulating samples and approaches to extracting useful binding energy information. The guide summarizes the causes of surface charging, how to recognize when it occurs, approaches to minimize charge buildup, and methods used to adjust or correct XPS photoelectron binding energies when charge control systems are used. There are multiple ways to control surface charge buildup during XPS measurements, and examples of systems on advanced XPS instruments are described. There is no single, simple, and foolproof way to extract binding energies on insulating material, but advantages and limitations of several approaches are described. Because of the variety of approaches and limitations of each, it is critical for researchers to accurately describe the procedures that have been applied in research reports and publications.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Chemistry Cardiff Catalysis Institute (CCI)
Publisher:	AIP Publishing and American Vacuum Society
ISSN:	0734-2101
Date of First Compliant Deposit:	30 April 2020
Date of Acceptance:	21 April 2020
Last Modified:	23 Apr 2024 18:29
URI:	https://orca.cardiff.ac.uk/id/eprint/131342

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