Gate bias incorporation into Cardiff behavioural modelling formulation

Azad, Ehsan M., Bell, James J. ORCID: https://orcid.org/0000-0002-4815-2199, Quaglia, Roberto ORCID: https://orcid.org/0000-0003-3228-301X, Moreno Rubio, Jorge J. ORCID: https://orcid.org/0000-0003-3376-4464 and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2020. Gate bias incorporation into Cardiff behavioural modelling formulation. Presented at: IEEE/MTT-S International Microwave Symposium (IMS 2020), Los Angeles, CA, USA, 4-6 August 2020. 2020 IEEE/MTT-S International Microwave Symposium (IMS). IEEE, pp. 420-423. 10.1109/IMS30576.2020.9223817

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Abstract

This paper presents a novel approach to incorporate gate bias voltage variations into the Cardiff behavioural model formulation. In particular, it is observed that the model coefficients can be expressed effectively as a linear function of bias voltage. As a result, the intensity of the load-pull measurement can decrease up to 80 % as the interpolation of the data with respect to the gate bias voltage can be exploited. The experiment was done on a 4 W GaN technology on-wafer device and the result is verified on 0.2 W GaAs technology device.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Published Online
Status:	Published
Schools:	Engineering
Additional Information:	© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Publisher:	IEEE
ISBN:	9781728168159
ISSN:	2576-7216
Funders:	Marie Skłodowska-Curie Action
Date of First Compliant Deposit:	4 January 2021
Date of Acceptance:	20 February 2020
Last Modified:	27 Nov 2022 12:36
URI:	https://orca.cardiff.ac.uk/id/eprint/136141

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