STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation

Slater, Thomas J.A. ORCID: https://orcid.org/0000-0003-0372-1551, Janssen, Arne, Camargo, Pedro H.C., Burke, M. Grace, Zaluzec, Nestor J. and Haigh, Sarah J. 2016. STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation. Ultramicroscopy 162 , pp. 61-73. 10.1016/j.ultramic.2015.10.007

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Abstract

This paper presents an investigation of the limitations and optimisation of energy dispersive X-ray (EDX) tomography within the scanning transmission electron microscope, focussing on application of the technique to characterising the 3D elemental distribution of bimetallic AgAu nanoparticles. The detector collection efficiency when using a standard tomography holder is characterised using a tomographic data set from a single nanoparticle and compared to a standard low background double tilt holder. Optical depth profiling is used to investigate the angles and origin of detector shadowing as a function of specimen field of view. A novel time-varied acquisition scheme is described to compensate for variations in the intensity of spectrum images at each sample tilt. Finally, the ability of EDX spectrum images to satisfy the projection requirement for nanoparticle samples is discussed, with consideration of the effect of absorption and shadowing variations.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Chemistry
Additional Information:	This is an open access article under the terms of the CC-BY Attribution 4.0 International license.
Publisher:	Elsevier
ISSN:	0304-3991
Date of First Compliant Deposit:	24 February 2022
Last Modified:	18 May 2023 20:12
URI:	https://orca.cardiff.ac.uk/id/eprint/147207

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