Thermal Modelling and Characterisation of Semiconductor Bolometers

Sudiwala, Rashmikant V. ORCID: https://orcid.org/0000-0003-3240-5304, Griffin, Matthew Joseph ORCID: https://orcid.org/0000-0002-0033-177X and Woodcraft, Adam 2002. Thermal Modelling and Characterisation of Semiconductor Bolometers. International Journal of Infrared and Millimetre Waves 23 (4) , pp. 545-573. 10.1023/A:1015705826900

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Abstract

A revised version of the Griffin & Holland ideal semiconductor bolometer model is presented and its use in determining bolometer properties and parameters from experimental load curve measurements is discussed. We show that degeneracy between some bolometer parameters can only be broken by model fitting a family of load curves over a range of bath temperatures, and that measurements with the bolometer blanked (zero absorbed radiant power) are essential for unambiguous determination of the main parameters. The influence of measurement errors on parameter recovery is analysed using synthetic noisy data sets.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Uncontrolled Keywords:	Cryogenic detectors - Bolometers - NTD
Publisher:	Springer
ISSN:	0195-9271
Last Modified:	17 Oct 2022 08:56
URI:	https://orca.cardiff.ac.uk/id/eprint/1552

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