Millimeter-wave on-wafer large signal characterization system for harmonic source/load pull and waveform measurements

Baddeley, Alexander, Woodington, Simon, Gecan, Dragan, Sheikh, Aamir, Lunn, Jamie, Tasker, Paul ORCID: https://orcid.org/0000-0002-6760-7830 and Quaglia, Roberto ORCID: https://orcid.org/0000-0003-3228-301X 2023. Millimeter-wave on-wafer large signal characterization system for harmonic source/load pull and waveform measurements. Presented at: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023, San Diego, USA, 11-16 June 2023. Proceedings of the 2023 IEEE/MTT-S International Microwave Symposium (IMS). IEEE, pp. 1101-1104. 10.1109/IMS37964.2023.10187929

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Abstract

This paper describes a large-signal single-sweep characterization system based on vector network analyzer receivers for on-wafer harmonic load/source pull measurements up to 110 GHz using passive tuners, and waveform measurements up to 100 GHz using an oscilloscope as a phase meter. The calibration and measurement procedures are described and validated with thru structures and on GaAs HEMTs at Ka-band demonstrating the capability to offer an important insight for both technology developers and designers of millimetre-wave transistors and amplifiers.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Publisher:	IEEE
ISBN:	9798350347654
ISSN:	0149-645X
Date of First Compliant Deposit:	15 August 2023
Date of Acceptance:	1 February 2023
Last Modified:	24 Aug 2023 14:00
URI:	https://orca.cardiff.ac.uk/id/eprint/161788

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