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EFM Phase Investigation of the Metal-Organic Film Interface

Das, Arindam, Lei, C. H., Thomas, Huw E., Elliott, Martin, Macdonald, John Emyr, Glarvey, P. and Turner, M. L. 2006. EFM Phase Investigation of the Metal-Organic Film Interface. Applied Surface Science 252 (15) , pp. 5477-5480. 10.1016/j.apsusc.2005.12.091

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Phase sensitive electrostatic force microscopy (EFM phase) investigations of semiconducting polymers, poly(3-hexylthiophene) (P3HT) and poly(9,9-dioctylfluorene) (F8), are described, aimed at understanding the metal/polymer interfaces. The electrostatic behaviour and potential distributions of the Au/polymer/Au structure under various biases with emphasis on top and bottom Au contacts are presented. We observe, by analysing EFM phase data, that the top and bottom contacts of Au can have drastic effects on the device performance. Moreover, differences in conductivity of conjugated polymers (P3HT > F8) are also reflected in EFM phase measurements, which correlate well with I–V measurements. Detailed analysis indicates that the influence of metal/film interfaces depends strongly on both the ability of charge transport properties of the organic films and the type of surface modification.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Q Science > QD Chemistry
Uncontrolled Keywords: Conjugated polymers; P3HT; F8; Electrostatic force microscopy; Metal contacts
ISSN: 0169-4332
Last Modified: 04 Jun 2017 01:41

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