Planar scans of localised near-fields emitted by RF voltages in devices

Al-Basha, Ahmed, Kuwata, Eigo, Perks, Richard ORCID: https://orcid.org/0000-0003-0873-0537 and Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 2025. Planar scans of localised near-fields emitted by RF voltages in devices. Presented at: 2024 IEEE Asia-Pacific Microwave Conference (APMC), Bali, Indonesia, 17-20 November 2024. 2024 IEEE Asia-Pacific Microwave Conference (APMC). pp. 283-285. 10.1109/apmc60911.2024.10867281

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Abstract

This paper presents a measurement system for contactless detection of the electric component of near-fields emitted by different points of RF devices. To account for the complex topology of the devices, tangential and normal field components are separated through a 3D data-based model from multiple E-field measurements at different distances from the device. In addition, a method for estimating topological height variations from the E-fields emanating from the device-under-test is also presented. The results obtained, show the distribution of E-field magnitude and phase across the entire device areas, with the possibility of compensating for the effects of the device topology.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Published Online
Status:	Published
Schools:	Schools > Engineering
Last Modified:	25 Feb 2025 11:30
URI:	https://orca.cardiff.ac.uk/id/eprint/176463

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