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XPS insight note: Coster–Kronig broadening

Isaacs, Mark A. ORCID: https://orcid.org/0000-0002-0335-4272, Davies, Phillip R., Graf, Arthur, Morgan, David J. ORCID: https://orcid.org/0000-0002-6571-5731 and Palgrave, Robert 2025. XPS insight note: Coster–Kronig broadening. Surface and Interface Analysis 10.1002/sia.7410

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Abstract

Inconsistent peak broadening of doublet peaks in X‐ray photoelectron spectroscopy is commonly observed for many transition metals, lanthanides and actinides, which may complicate peak fitting—especially for newer practitioners. In this insight note, we discuss why this broadening occurs, what governs the degree of broadening and how analysts and spectroscopists can account for this in their modelling.

Item Type: Article
Date Type: Published Online
Status: In Press
Schools: Schools > Chemistry
Additional Information: License information from Publisher: LICENSE 1: URL: http://creativecommons.org/licenses/by/4.0/
Publisher: Wiley
ISSN: 0142-2421
Date of First Compliant Deposit: 13 May 2025
Date of Acceptance: 5 May 2025
Last Modified: 13 May 2025 10:15
URI: https://orca.cardiff.ac.uk/id/eprint/178230

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