RF Waveform Measurement and Engineering

Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2009. RF Waveform Measurement and Engineering. Presented at: Annual IEEE Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009, Greensboro, NC, USA, 11-14 October 2009. Integrated Circuits in GaAs, InP, SiGe, GaN, and Other Compound Semiconductors - Proceedings of the Annual IEEE Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009. Los Alamitos, CA: IEEE, 10.1109/csics.2009.5315818

Full text not available from this repository.

Abstract

RF I-V waveform measurement and engineering systems are finally enabling practical waveform engineering to be directly undertaken within the RF power amplifier (RFPA) design cycle. RFPAs are a critical component in many systems; e.g. mobile communications, satellite communications and radar systems.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher:	IEEE
ISBN:	9781424451913
Last Modified:	21 Oct 2022 09:25
URI:	https://orca.cardiff.ac.uk/id/eprint/36320

Citation Data

Cited 3 times in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item