Validation of load-independent X-parameters

Pelaez-Perez, A. M., Alonso, J. I., Fernandez-Barciela, M. and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2011. Validation of load-independent X-parameters. Presented at: Active RF Devices, Circuits and Systems Seminar, Belfast, Northern Ireland, 12 September 2011. Active RF Devices, Circuits and Systems Seminar. IEEE, pp. 47-50. 10.1049/ic.2011.0212

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Abstract

Recently analytical behavioral model formulation based on the PHD model has been introduced and successfully used to describe the nonlinear behavior of transistors and components [1–3]. The next important advance would be to utilize this formulation, constraint to load-independent X parameters, to enable analytical non-linear microwave circuit design procedures. For this purpose, in this paper a blind iterative process is presented and validated in order to obtain the appropriate load-independent X parameters, focused around the chosen optimum impedance condition, necessary to enable accurate analytical non-linear circuit design to be undertaken [4].

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Publisher:	IEEE
ISBN:	9781849195409
Last Modified:	24 Oct 2022 10:25
URI:	https://orca.cardiff.ac.uk/id/eprint/44202

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