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X-ray diffraction from rough, relaxed and reconstructed surfaces

Vlieg, E., Van Der Veen, J. F., Gurman, S. J., Norris, C. and MacDonald, John Emyr 1989. X-ray diffraction from rough, relaxed and reconstructed surfaces. Surface Science 210 (3) , pp. 301-321. 10.1016/0039-6028(89)90598-0

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A general formalism is presented for computing the scattered X-ray intensity from surfaces showing disorder in the form of atomic-scale roughness or in the form of reconstructed domains of finite size. Special attention is paid to the interference between bulk and surface contributions, since this is important in the determination of relaxation parameters or of the registry of a surface unit cell.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: Elsevier
ISSN: 0039-6028
Last Modified: 04 Jun 2017 04:53

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