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The structure of the surface determined using X-ray diffraction

Conway, K. M., MacDonald, John Emyr, Norris, C., Vlieg, E. and van der Veen, J. F. 1989. The structure of the surface determined using X-ray diffraction. Surface Science 215 (3) , pp. 555-565. 10.1016/0039-6028(89)90275-6

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The structure of the View the MathML source reconstruction induced by adsorption of View the MathML source of a monolayer of Sn on the Si(111) surface has been determined using surface X-ray diffraction. The in-plane projection of the surface structure, obtained from structure factors near zero perpendicular momentum transfer, indicates substantial lateral displacements of the Si atoms. Intensity profiles of the fractional order rods give information concerning displacements normal to the surface. The adatoms are shown to occupy sites above second layer Si atoms. Incorporation of elastic strain minimisation into the structure factor analysis enables the identification of relaxations extending six layers into the bulk.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: Elsevier
ISSN: 0039-6028
Last Modified: 04 Jun 2017 04:53

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