Double crystal x-ray-diffraction characterization of InSb/CdTe superlattice structures

Barnett, S. J., Golding, T. D., MacDonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692, Conway, K. M., Whitehouse, C. R. and Dinan, J. E. 1989. Double crystal x-ray-diffraction characterization of InSb/CdTe superlattice structures. Institute of Physics: Conference Series 100 , 485 -490.

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Abstract

Double crystal x-ray diffraction has been exploited to study the structural quality of InSb/CdTe superlattices grown by molecular beam epitaxy. For most samples studied intense well resolved superlattice reflection are observed. The angular width of the envelope of superlattice reflections is, however, several times that theoretically predicted for a uniform InSb/CdTe superlattice of the dimensions studied herein. This feature has been investigated by fitting theoretical rocking curves calculated using dynamical diffraction theory to the experimental curves and is explained in terms of a thin (< 20 angstrom) highly strained layer at the InSb/CdTe interfaces.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	IOP Publishing
ISSN:	0951-3248
Related URLs:	Publisher
Last Modified:	24 Oct 2022 11:21
URI:	https://orca.cardiff.ac.uk/id/eprint/47818

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