Study of silicon tip wear during AFM probe-based machining of single crystal copper

Mukhtar, Nur Farah Hafizah, Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189 and Prickett, Paul William ORCID: https://orcid.org/0000-0001-8985-7278 2014. Study of silicon tip wear during AFM probe-based machining of single crystal copper. Presented at: Ninth International Conference on MicroManufacturing (ICOMM 2014), Nanyang Technological University (NTU) and National University of Singapore (NUS), Singapore, 25-28 March 2014.

Full text not available from this repository.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Completion
Status:	Unpublished
Schools:	Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC) Engineering
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Related URLs:	Organisation
Last Modified:	05 Jan 2024 04:49
URI:	https://orca.cardiff.ac.uk/id/eprint/59798

Actions (repository staff only)

Edit Item