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Z-Spec: a broadband, direct-detection, millimeter-wave spectrometer

Phillips, Thomas G., Naylor, Bret J., Ade, Peter A. R., Bock, James J., Bradford, Charles M., Dragovan, Mark, Duband, Lionel, Earle, Lieko, Glenn, Jason, Matsuhara, Hideo, Nguyen, Hien, Yun, Minhee, Zmuidzinas, Jonas and Zmuidzinas, Jonas 2003. Z-Spec: a broadband, direct-detection, millimeter-wave spectrometer. Presented at: Millimeter and Submillimeter Detectors for Astronomy, Waikoloa, HI, USA, 25 August 2002. Published in: Phillips, Thomas G. and Zmuidzinas, Jonas eds. Millimeter and Submillimeter Detectors for Astronomy (Proceedings). Proceedings of Spie , vol. 4855. Bellingham, WA: SPIE, pp. 239-248. 10.1117/12.459419

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Z-Spec is a broadband (195 - 310 GHz), direct-detection, millimeter-wave spectrometer with moderate resolution (R ~ 350) that we are building to observe CO rotational lines and atomic fine-structure lines in the recently discovered population of submillimeter galaxies. A large fraction of these sources cannot be identified optically and thus redshift determination is extremely difficult. The large instantaneous bandwidth of Z-Spec will allow measurement of redshifts up to z~4 via detection of two or more CO lines in a single spectrum. The spectrometer is based on a parallel-plate waveguide grating architecture that is substantially more compact than a conventional free-space grating system. The spectrometer and an array of 160 silicon nitride micromesh bolometers will be cooled to 100 mK to provide background-limited sensitivity. In addition to measuring the redshifts of sources discovered in submillimeter continuum surveys, Z-Spec will demonstrate a novel spectrometer concept well-suited for future far-infrared space missions.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QB Astronomy
Uncontrolled Keywords: Extremely high frequency ; Spectrometers ; Waveguides ; Bolometers ; Far infrared ; Free space ; Galactic astronomy ; Silicon
Publisher: SPIE
ISBN: 9780819446343
ISSN: 0277-786X
Last Modified: 04 Jun 2017 06:29

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