Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull

Akmal, Muhammad, Ogboi, Friday Lawrence, Yusoff, Zubaida Binti, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Carrubba, Vincenzo, Choi, Heungjae ORCID: https://orcid.org/0000-0003-1108-293X, Bensmida, S., Morris, K., Beach, M., McGeehan, J., Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2012. Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull. Presented at: 7th European Microwave Integrated Circuits Conference, Amsterdam, The Netherlands, 29-30 October 2012. 7th European Microwave Integrated Circuits Conference (EuMIC), 2012. Proceedings of the 7th European Microwave Integrated Circuits Conference. Picastaway, NJ: IEEE, pp. 885-888.

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Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Publisher:	IEEE
ISBN:	9782874870286
Last Modified:	27 Oct 2022 08:50
URI:	https://orca.cardiff.ac.uk/id/eprint/63538

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