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Reduction and calibration of the MIPS 70 and 160 micron detectors

Gordon, K. D., Rieke, G. H., Young, E .T., Ade, Peter A. R., Alonso-Herrero, A., Beichman, C., Dole, H., Egami, E., Engelbracht, C., Gautier, T. N., deGraauw, T., Haller, E. E., Hines, D., Kelly, D., Lada, C., Latter, W., Low, F. J., Misselt, K., Morrison, J., Mould, J., Muzerolle, J., Neugebauer, G. X., Papovich, C., Richards, P. L., Rieke, M. J., Rivlis, G., Stansberry, J., Stapelfeldt, K., Su, K. Y. and Werner, M. W. 2001. Reduction and calibration of the MIPS 70 and 160 micron detectors. Bulletin of the American Astronomical Society 33 (4)

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The Multiband Imaging Photometer for SIRTF (MIPS) will be one of the three instruments on the Space Infrared Telescope Facility (SIRTF). MIPS will produce images at 24 (128x128 pixels), 70 (32x32 pixels), and 160 (2x20 pixels) microns using Si:As (24 micron) and Ge:Ga (70 and 160 microns) based detectors. The reduction and calibration of the Ge:Ga images present special challenges due to the nature of the bulk photoconductive detectors. The observing strategy of MIPS has been specifically designed to make the reduction and calibration of the Ge:Ga images quite robust and is different from that employed by the Infrared Space Observatory (ISO). The observations are carried out in the fast not the slow time domain, i.e. sources do not stay on the same detector pixels between exposures (3, 4, or 10 seconds). In addition, all data are taken with a high degree of redundancy and a flat field is taken every 2 minutes. The repeatability of this flat field is better than 1%. Worst case source flux repeatability of 10-15% has also been demonstrated. The general outline of the Ge:Ga data reduction and calibration will be presented. This includes continuing characterization work in the laboratory with flight-like arrays which allows for the ongoing study of the behavior of Ge:Ga detectors.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QB Astronomy
Additional Information: Abstract only. Session 44.02/ Display. SIRTF and Infrared Space Instruments. Abstract No 44.02. Page numbers not available.
Publisher: American Astronomical Society
ISBN: 0002-7537
ISSN: 0002-7537
Last Modified: 04 Jun 2017 06:40

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