Modelling and measurement of Frequency Selective Surfaces

Ade, Peter A. R. ORCID: https://orcid.org/0000-0002-5127-0401, Tucker, Carole ORCID: https://orcid.org/0000-0002-1851-3918, Pisano, Giampaolo ORCID: https://orcid.org/0000-0003-4302-5681 and Weaver, S. 2008. Modelling and measurement of Frequency Selective Surfaces. Presented at: 2007 Joint 32nd International Conference on Infrared and Millimeter Waves and 15th International Conference on Terahertz Electronics, 2-9 Sept 2007, Caridff, UK. 2007 Joint 32nd International Conference on Infrared and Millimeter Waves and 15th International Conference on Terahertz Electronics. Conference Proceedings , vol.1 IEEE (Curran Associates Incorporated), pp. 771-772.

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Abstract

Frequency selective surfaces, FSS's, are used to make filters in the far infrared and submillimetre region, which can have low-pass, high-pass and band selection properties. For basic characterisation of grid optical properties we use transmission line theory. In addition it has proven necessary to use high frequency structure simulator software, HFFS, to investigate the Woods-type anomalies and the absorption observed in these devices.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QB Astronomy
Publisher:	IEEE (Curran Associates Incorporated)
ISBN:	9781424414383
Related URLs:	Organisation
Last Modified:	27 Oct 2022 09:28
URI:	https://orca.cardiff.ac.uk/id/eprint/66008

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