A measurement test-set for characterisation of high power LDMOS transistors including memory effects

Alghanim, A., Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul ORCID: https://orcid.org/0000-0002-6760-7830 2005. A measurement test-set for characterisation of high power LDMOS transistors including memory effects. Presented at: 10th IEEE High Frequency Postgraduate Student Colloquium, Leeds, UK, pp. 29-32.

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Item Type:	Conference or Workshop Item (Paper)
Schools:	Schools > Engineering
Last Modified:	17 Oct 2022 10:22
URI:	https://orca.cardiff.ac.uk/id/eprint/7823

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