Brien, Thomas, Ade, Peter ORCID: https://orcid.org/0000-0002-5127-0401, Barry, Peter, Dunscombe, Christopher, Leadley, D. R., Morozov, Dmitry, Myrononv, M., Parker, E. H. C, Prest, Martin, Prunnila, M., Sudiwala, Rashmikant ORCID: https://orcid.org/0000-0003-3240-5304, Whall, T. E. and Mauskopf, Philip ORCID: https://orcid.org/0000-0001-6397-5516
2016.
Optical response of strained- and unstrained-silicon cold-electron bolometers.
Journal of Low Temperature Physics
184
, pp. 231-237.
10.1007/s10909-016-1569-x
|
Preview |
PDF
- Published Version
Available under License Creative Commons Attribution. Download (704kB) | Preview |
Abstract
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of a small (32 × 14 µm) island of degenerately doped silicon with Superconducting aluminium contacts. Radiation is coupled into the silicon absorber with a twin-slot antenna designed to couple to 160-GHz radiation through a silicon lens.The first device has ahighly doped silicon absorber, the second has ahighly doped strained-silicon absorber. Using a novel method of cross-correlating the outputs from two parallel amplifiers, we measure noise-equivalent powers of 3.0×10−16 and 6.6×10^−17 W/rtHz for the control and strained device, respectively,when observing radiation from a 77-K source. In the case of the strained device, the noise-equivalent power is limited by the photon noise.
| Item Type: | Article |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Schools > Physics and Astronomy |
| Subjects: | Q Science > QB Astronomy Q Science > QC Physics |
| Publisher: | Springer |
| ISSN: | 0022-2291 |
| Funders: | EPSRC, STFC, Academy of Finland |
| Date of First Compliant Deposit: | 30 March 2016 |
| Date of Acceptance: | 24 February 2016 |
| Last Modified: | 17 Aug 2024 06:36 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/87723 |
Citation Data
Cited 5 times in Scopus. View in Scopus. Powered By Scopus® Data
Actions (repository staff only)
![]() |
Edit Item |





Altmetric
Altmetric