Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation

Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel Bruno Jean-Paul ORCID: https://orcid.org/0000-0003-2728-3189 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016. Published in: Bointon, P., Leach, R. and Southon, N. eds. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Bedford: EUSPEN, pp. 59-60.

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Item Type:	Conference or Workshop Item (Poster)
Date Type:	Publication
Status:	Published
Schools:	Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC) Engineering
Subjects:	T Technology > TS Manufactures
Publisher:	EUSPEN
ISBN:	9780956679086
Last Modified:	01 Nov 2022 10:27
URI:	https://orca.cardiff.ac.uk/id/eprint/91524

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