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Giant reflection coefficient on Sc 0.26 Al 0.74 N polycrystalline diamond surface acoustic wave resonators

Sinusía Lozano, Miguel, Chen, Zhuohui, Williams, Oliver A. ORCID: and Iriarte, Gonzalo F. 2019. Giant reflection coefficient on Sc 0.26 Al 0.74 N polycrystalline diamond surface acoustic wave resonators. physica status solidi (a) 216 (20) , 1900360. 10.1002/pssa.201900360

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Since the commercialization of surface acoustic wave (SAW) devices, the technology is steadily increasing the device performances without compromising their power handling, size and price. Herein, one‐port SAW resonators are fabricated on scandium aluminum nitride (Sc0.26Al0.74N)/polycrystalline diamond heterostructures. SAW propagation properties are studied using three different piezoelectric thin‐film thicknesses within the heterostructure. The Rayleigh and Sezawa resonance frequencies are above 1.5 and 2.5 GHz, respectively, achieving Sezawa mode reflection coefficients below −50 dB. The polycrystalline diamond substrate is synthesized by microwave plasma chemical vapor deposition (MPCVD) on top of a 500 μm‐thick Si (001) substrate. The Sc0.26Al0.74N thin films are synthesized by reactive sputtering at nominally room temperature. The thin film's composition is analyzed by Rutherford backscattering spectrometry (RBS). The full width at half maximum (FWHM) of the X‐ray diffraction (XRD) ω scans below 3° indicates that the synthesized Sc0.26Al0.74N thin films are highly c‐axis oriented. The electromechanical coupling coefficient, quality factor, and dielectric loss parameters are computed by curve fitting the device electrical measurements to the simulation results of a modified Butterworth Van Dyke (mBVD) model implemented in the advance design system (ADS) tool.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Publisher: Wiley
ISSN: 1862-6300
Date of First Compliant Deposit: 25 November 2019
Date of Acceptance: 2 August 2019
Last Modified: 07 Nov 2023 08:27

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