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Revealing new atomic-scale information about materials by improving the quality and quantifiability of aberration-corrected STEM data

Yankovich, Andrew B., Feng, Jie, Kvit, Alex, Slater, Thomas, Haigh, Sarah, Morgan, Dane and Voyles, Paul M. 2015. Revealing new atomic-scale information about materials by improving the quality and quantifiability of aberration-corrected STEM data. Microscopy and Microanalysis 21 (S3) , pp. 2409-2410. 10.1017/s1431927615012829

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Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Cardiff Catalysis Institute (CCI)
Publisher: Cambridge University Press
ISSN: 1431-9276
Last Modified: 21 Mar 2022 11:45
URI: https://orca.cardiff.ac.uk/id/eprint/147215

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