Revealing new atomic-scale information about materials by improving the quality and quantifiability of aberration-corrected STEM data

Yankovich, Andrew B., Feng, Jie, Kvit, Alex, Slater, Thomas ORCID: https://orcid.org/0000-0003-0372-1551, Haigh, Sarah, Morgan, Dane and Voyles, Paul M. 2015. Revealing new atomic-scale information about materials by improving the quality and quantifiability of aberration-corrected STEM data. Microscopy and Microanalysis 21 (S3) , pp. 2409-2410. 10.1017/s1431927615012829

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Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Chemistry Cardiff Catalysis Institute (CCI)
Publisher:	Cambridge University Press
ISSN:	1431-9276
Last Modified:	10 Nov 2022 10:33
URI:	https://orca.cardiff.ac.uk/id/eprint/147215

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