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Photo induced Force Microscopy: chemical spectroscopy beyond the diffraction limit

Davies, Philip R. Rosser ORCID: and Davies-Jones, Josh 2022. Photo induced Force Microscopy: chemical spectroscopy beyond the diffraction limit. Materials Chemistry Frontiers 6 (12) , pp. 1552-1573. 10.1039/D2QM00040G

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Over the last decade remarkable advances have been made in creating spectroscopic tools to interrogate surface properties using electromagnetic radiation in the near field, achieving lateral resolutions in the nanometre range. We review recent work involving one of the most promising of these spectroscopic tools, photo induced force microscopy (PiFM), which uses mechanical detection of dipole-dipole interactions enabling nanometre resolved mapping of surface properties ranging from vibrational modes of adsorbates to plasmon resonances. We discuss the origin of contrast in PiFM images, its applications as a local probe of chemical species and for mapping local electric fields in areas as diverse as zeolite films and biometric recognition. In comparison with related techniques such as photo thermal infrared spectroscopy (PTIR) and tip enhanced Raman spectroscopy (TERS) PiFM has many advantages but perhaps its most successful application is in combination with other surface characterisation methods which provide information averaged over much greater surface areas. We discuss the most recent developments of PiFM technology which are leading to higher resolution images and are widening the range of environments in which the technique can be applied, and we consider how the field is likely to progress in the future.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Cardiff Catalysis Institute (CCI)
Additional Information: This article is licensed under a Creative Commons Attribution 3.0 Unported Licence
Publisher: Royal Society of Chemistry
ISSN: 2052-1537
Date of First Compliant Deposit: 12 April 2022
Date of Acceptance: 29 March 2022
Last Modified: 15 May 2023 14:09

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