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Revisiting degradation in the XPS analysis of polymers

Morgan, David J. ORCID: and Uthayasekaran, Sharukaa 2023. Revisiting degradation in the XPS analysis of polymers. Surface and Interface Analysis 55 (6-7) , pp. 556-563. 10.1002/sia.7151

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A study on the degradation of both halogenated and non‐halogenated polymers has been made by x‐ray photoelectron spectroscopy on two different types of common place photoelectron spectrometer. The degradation results herein are compared with the degradation index of Beamson and Briggs, and a notable difference was observed. The effects of neutraliser and spot size on the degradation kinetics are explored and lead to simple recommendations for the successful analysis of damage‐susceptible polymers.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Additional Information: License information from Publisher: LICENSE 1: URL:
Publisher: Wiley
ISSN: 0142-2421
Funders: EPSRC
Date of First Compliant Deposit: 20 September 2022
Date of Acceptance: 8 September 2022
Last Modified: 28 Jul 2023 08:53

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