Behavioral model analysis using simultaneous active fundamental load-pull and harmonic source-pull measurements at X-band

Bell, James Joseph ORCID: https://orcid.org/0000-0002-4815-2199, Saini, Randeep, Woodington, Simon Philip, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349, Cripps, Stephen Charles ORCID: https://orcid.org/0000-0002-2258-951X and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2011. Behavioral model analysis using simultaneous active fundamental load-pull and harmonic source-pull measurements at X-band. Presented at: 2011 IEEE/MTT-S International Microwave Symposium, Baltimore, MD, USA, 5-10 June 2011. Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International. New York: IEEE, pp. 982-986. 10.1109/MWSYM.2011.5972803

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Abstract

Recently there has been a renewed interest in improving power amplifier performance via input waveform engineering. In order to support this development it is important that non-linear behavioral device models can accurately describe and fully account for the high levels of input harmonic signal injection necessary. The work presented in this paper introduces an adapted mixing model formulation, which was used to extract input second harmonic model coefficients from a set of simultaneous active fundamental load-pull and harmonic source-pull measurements at 9 GHz. It was observed that a fourth order model was sufficient to capture the response of the scattered travelling b2,1 and b2,2 waves to a confidence of 99.46% and 97.62% respectively of the measured data. Hereafter the behavioral model was used to accurately generate the full fundamental output impedance space and the respective port current and voltage waveforms within a CAD environment.

Item Type:	Conference or Workshop Item (Paper)
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TJ Mechanical engineering and machinery
Uncontrolled Keywords:	HEMTs; MMICs; Modeling; Nonlinear systems; Scattering parameters
Additional Information:	Proceedings of a meeting held 5-10 June 2011, Baltimore, Maryland, USA.
Publisher:	IEEE
ISBN:	9781612847542
Last Modified:	18 Oct 2022 13:49
URI:	https://orca.cardiff.ac.uk/id/eprint/15577

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