XPS insights: Sample degradation in X-ray photoelectron spectroscopy

Morgan, David J. ORCID: https://orcid.org/0000-0002-6571-5731 2023. XPS insights: Sample degradation in X-ray photoelectron spectroscopy. Surface and Interface Analysis 55 (5) , pp. 331-335. 10.1002/sia.7205

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Abstract

Standard X-ray photoelectron spectroscopy (XPS) analysis is thought of by many as a non-destructive form of analysis; however, both the interaction of the X-ray photons and the subsequent electron cascade can cause significant changes to the analysed area. This XPS Insights paper gives a brief overview to this phenomenon, supported by specific examples and experimental advice to assess and minimise damage during analysis.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Chemistry Cardiff Catalysis Institute (CCI)
Publisher:	Wiley
ISSN:	0142-2421
Funders:	EPSRC
Date of First Compliant Deposit:	2 March 2023
Date of Acceptance:	7 February 2023
Last Modified:	19 Jun 2023 16:23
URI:	https://orca.cardiff.ac.uk/id/eprint/157444

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