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XPS insights: Sample degradation in X-ray photoelectron spectroscopy

Morgan, David J. ORCID: 2023. XPS insights: Sample degradation in X-ray photoelectron spectroscopy. Surface and Interface Analysis 55 (5) , pp. 331-335. 10.1002/sia.7205

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Standard X-ray photoelectron spectroscopy (XPS) analysis is thought of by many as a non-destructive form of analysis; however, both the interaction of the X-ray photons and the subsequent electron cascade can cause significant changes to the analysed area. This XPS Insights paper gives a brief overview to this phenomenon, supported by specific examples and experimental advice to assess and minimise damage during analysis.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Cardiff Catalysis Institute (CCI)
Publisher: Wiley
ISSN: 0142-2421
Funders: EPSRC
Date of First Compliant Deposit: 2 March 2023
Date of Acceptance: 7 February 2023
Last Modified: 02 May 2023 16:39

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