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Noise optimization for MKIDs with different design geometries and material selections

Pan, Z., Dibert, K. R., Zhang, J., Barry, Peter, Anderson, A. J., Bender, A. N., Benson, B. A., Cecil, T., Chang, C. L., Gualtieri, R., Li, J., Lisovenko, M., Novosad, V., Rouble, M., Wang, G. and Yefremenko, V. 2023. Noise optimization for MKIDs with different design geometries and material selections. IEEE Transactions on Applied Superconductivity 33 (5) 10.1109/TASC.2023.3250167

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The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. We analyze the effect of several changes to the lumped-element inductor and interdigitated capacitor geometry on the noise performance of a series of MKIDs intended for millimeter-wavelength experiments. We extract the contributions from two-level system noise in the dielectric layer, the generation-recombination noise intrinsic to the superconducting thin-film, and system white noise from each detector noise power spectrum and characterize how these noise components depend on detector geometry, material, and measurement conditions such as driving power and temperature. We observe a reduction in the amplitude of two-level system noise with both an elevated sample temperature and an increased gap between the fingers within the interdigitated capacitors for both aluminum and niobium detectors. We also verify the expected reduction of the generation-recombination noise and associated quasiparticle lifetime with reduced inductor volume. This study also iterates over different materials, including aluminum, niobium, and aluminum manganese, and compares the results with an underlying physical model.

Item Type: Article
Date Type: Published Online
Status: Published
Schools: Physics and Astronomy
Publisher: Institute of Electrical and Electronics Engineers
ISSN: 1051-8223
Date of First Compliant Deposit: 30 March 2023
Date of Acceptance: 24 February 2023
Last Modified: 05 May 2023 08:37

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