RF waveform method for the determination of the safe operating area of GaN HFET's for amplifiers subjected to high output VSWR

McGenn, W., Powell, J., Uren, M., Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul ORCID: https://orcid.org/0000-0002-6760-7830 2010. RF waveform method for the determination of the safe operating area of GaN HFET's for amplifiers subjected to high output VSWR. Presented at: European Microwave Week 2010: Connecting the World, (EuMIC 2010), Paris, France, (561371) pp. 282-285.

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Item Type:	Conference or Workshop Item (Paper)
Schools:	Engineering
Last Modified:	18 Oct 2022 14:12
URI:	https://orca.cardiff.ac.uk/id/eprint/16800

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