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Optimization of chemical displacement deposition of copper on porous silicon

Bandarenka, Hanna ORCID: https://orcid.org/0000-0003-4254-8261, Redko, Sergey, Nenzi, Paolo, Balucani, Marco and Balucani, Marco 2012. Optimization of chemical displacement deposition of copper on porous silicon. Journal of Nanoscience and Nanotechnology 12 (11) , pp. 8725-8731. 10.1166/jnn.2012.6470

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Abstract

Copper (II) sulfate was used as a source of copper to achieve uniform distribution of Cu particles deposited on porous silicon. Layers of the porous silicon were formed by electrochemical anodization of Si wafers in a mixture of HF, C3H7OH and deionized water. The well-known chemical displacement technique was modified to grow the copper particles of specific sizes. SEM and XRD analysis revealed that the outer surface of the porous silicon was covered with copper particles of the crystal orientation inherited from the planes of porous silicon skeleton. The copper crystals were found to have the cubic face centering elementary cell. In addition, the traces of Cu2O cubic primitive crystalline phases were identified. The dimensions of Cu particles were determined by the Feret's analysis of the SEM images. The sizes of the particles varied widely from a few to hundreds of nanometers. A phenomenological model of copper deposition was proposed.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Schools > Physics and Astronomy
Publisher: American Scientific Publishers
ISSN: 1533-4880
Last Modified: 07 Sep 2026 21:56
URI: https://orca.cardiff.ac.uk/id/eprint/188579

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