Characterization of copper nanostructures grown on porous silicon by displacement deposition

Bandarenka, Hanna ORCID: https://orcid.org/0000-0003-4254-8261, Petrovich, Vladimir, Komar, Olga, Nenzi, Paolo, Balucani, Marco and Bondarenko, Vitaly 2012. Characterization of copper nanostructures grown on porous silicon by displacement deposition. ECS Transactions 41 (45) , 13. 10.1149/1.4711400

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Abstract

Different copper nanostructures have been deposited onto porous silicon (PS) by using HF-based solutions of CuSO4 and immersion technique. The variation of the porous template parameters and deposition regimes has been found to allow obtaining of copper nanoparticles, copper rough films and porous copper layers. The dimensions, roughness, structural parameters and phase composition of the obtained copper nanostructures have been established.

Item Type:	Article
Status:	Published
Schools:	Schools > Physics and Astronomy
Publisher:	The Electrochemical Society
ISSN:	1938-5862
Last Modified:	07 Sep 2026 21:56
URI:	https://orca.cardiff.ac.uk/id/eprint/188581

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