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A quick scan method for supply chain diagnostic

Childerhouse, P., Disney, Stephen Michael ORCID: and Naim, Mohamed Mohamed ORCID: 1999. A quick scan method for supply chain diagnostic. Presented at: 4th International Symposium on Logistics, Florence, Italy, 11-14 July 1999. Published in: Muffatto, Moreno and Pawar, Kulwant eds. Proceedings of the 4th International Symposium on Logistics: Logistics in the Information Age, Florence, Italy, 11-14 July 1999. Padova: SGE, pp. 761-775.

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Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Business (Including Economics)
Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Publisher: SGE
ISBN: 9788886281379
Last Modified: 21 Oct 2022 10:22

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