A quick scan method for supply chain diagnostic

Childerhouse, P., Disney, Stephen Michael ORCID: https://orcid.org/0000-0003-2505-9271 and Naim, Mohamed Mohamed ORCID: https://orcid.org/0000-0003-3361-9400 1999. A quick scan method for supply chain diagnostic. Presented at: 4th International Symposium on Logistics, Florence, Italy, 11-14 July 1999. Published in: Muffatto, Moreno and Pawar, Kulwant eds. Proceedings of the 4th International Symposium on Logistics: Logistics in the Information Age, Florence, Italy, 11-14 July 1999. Padova: SGE, pp. 761-775.

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Item Type:	Conference or Workshop Item - published (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Business (Including Economics) Research Institutes & Centres > Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Publisher:	SGE
ISBN:	9788886281379
Date of First Compliant Deposit:	28 August 2026
Last Modified:	28 Aug 2026 10:00
URI:	https://orca.cardiff.ac.uk/id/eprint/39973

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