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X-ray birefringence imaging

Palmer, Benjamin A., Edwards-Gau, Gregory R., Kariuki, Benson M. ORCID:, Harris, Kenneth D. M. ORCID:, Dolbnya, Igor P. and Collins, Stephen P. 2014. X-ray birefringence imaging. Science 344 (6187) , pp. 1013-1016. 10.1126/science.1253537

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The polarizing optical microscope has been used since the 19th century to study the structural anisotropy of materials, based on the phenomenon of optical birefringence. In contrast, the phenomenon of x-ray birefringence has been demonstrated only recently and has been shown to be a sensitive probe of the orientational properties of individual molecules and/or bonds in anisotropic solids. Here, we report a technique—x-ray birefringence imaging (XBI)—that enables spatially resolved mapping of x-ray birefringence of materials, representing the x-ray analog of the polarizing optical microscope. Our results demonstrate the utility and potential of XBI as a sensitive technique for imaging the local orientational properties of anisotropic materials, including characterization of changes in molecular orientational ordering associated with solid-state phase transitions and identification of the size, spatial distribution, and temperature dependence of domain structures.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Subjects: Q Science > QD Chemistry
Publisher: American Association for the Advancement of Science
ISSN: 0036-8075
Date of Acceptance: 29 April 2014
Last Modified: 25 Oct 2022 09:48

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