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Polarization contrast in reflection near-field optical microscopy with uncoated fibre tips

Bozhevolnyi, S. I., Langbein, Wolfgang Werner ORCID: and Hvam, J. M. 1999. Polarization contrast in reflection near-field optical microscopy with uncoated fibre tips. Journal of Microscopy 194 (2-3) , pp. 500-506. 10.1046/j.1365-2818.1999.00502.x

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Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconductor wafers, we investigate the imaging characteristics of a reflection near-field optical microscope with an uncoated fibre tip for different polarization configurations and light wavelengths. It is shown that cross-polarized detection allows one to effectively suppress far-field components in the detected signal and to realize imaging of optical contrast on the sub-wavelength scale. The sensitivity window of our microscope, i.e. the scale on which near-field optical images represent mainly optical contrast, is found to be ≈100 nm for light wavelengths in the visible region. We demonstrate imaging of near-field components of a dipole field and purely dielectric contrast (related to well-width fluctuations in a semiconductor quantum well) with a spatial resolution of ≈100 nm. The results obtained show that such a near-field technique can be used for polarization-sensitive imaging with reasonably high spatial resolution and suggest a number of applications for this technique.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Uncontrolled Keywords: Contrast mechanisms; near-field optics; polarization contrast; resolution; scanning near-field optical microscopy
Publisher: Wiley
ISSN: 0022-2720
Last Modified: 28 Oct 2022 08:41

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