Alghanim, A., Benedikt, Johannes and Tasker, Paul 2005. A measurement test-set for characterisation of high power LDMOS transistors including memory effects. Presented at: 10th IEEE High Frequency Postgraduate Student Colloquium, Leeds, UK, pp. 29-32. |
Item Type: | Conference or Workshop Item (Paper) |
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Schools: | Engineering |
Last Modified: | 04 Jun 2017 02:02 |
URI: | https://orca.cardiff.ac.uk/id/eprint/7823 |
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