Optical constants of evaporated gold films measured by surface plasmon resonance at telecommunication wavelengths

Lee, Wook-Jae ORCID: https://orcid.org/0000-0001-8430-4797, Kim, Jae-Eun, Park, Hae Yong, Park, Suntak, Kim, Min-su, Kim, Jin Tae and Ju, Jung Jin 2008. Optical constants of evaporated gold films measured by surface plasmon resonance at telecommunication wavelengths. Journal of Applied Physics 103 (7) , 073713. 10.1063/1.2902395

Full text not available from this repository.

Abstract

We report the first measurement of the optical constants of evaporated goldfilms by using the surface plasmon resonance curve fitting method with an attenuated total reflection device from 16 to 70 nm thickness at telecommunication wavelengths. The results that were obtained by surface plasmon resonance measurement are in good agreement with those obtained by ellipsometry. Until now, optical constants of thin metalfilms are known to change according to the thickness due to the variation of the electrical resistivity. This phenomenon is also verified in this study by a simple surface plasmon resonance measurement. It is observed that for the goldfilms of thicknesses of less than 20 nm, the real part of the refractive index increases and the imaginary part decreases with decreasing film thickness.

Item Type:	Article
Date Type:	Published Online
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	American Institute of Physics
ISSN:	0021-8979
Date of Acceptance:	22 January 2008
Last Modified:	01 Nov 2022 09:56
URI:	https://orca.cardiff.ac.uk/id/eprint/89718

Citation Data

Cited 32 times in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item