ORCA
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Up a levelNumber of items: 4.
Clark, D.  ORCID: https://orcid.org/0000-0002-1090-2361, Guo, Dongsheng, Lathi, D., Harid, N. ORCID: https://orcid.org/0000-0001-8203-1895, Griffiths, H., Ainsley, Alan and Haddad, A. ORCID: https://orcid.org/0000-0003-4153-6146
2014.
Controlled large-scale tests of practical grounding electrodes--part II: comparison of analytical and numerical predictions with experimental results.
IEEE Transactions on Power Delivery
29
(3)
, pp. 1240-1248.
10.1109/TPWRD.2014.2298358
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Guo, Dongsheng, Clark, David ORCID: https://orcid.org/0000-0002-1090-2361, Lathi, Deepak Kamlakar, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895, Griffiths, Huw, Ainsley, Alan and Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146
2014.
Controlled large-scale tests of practical grounding electrodes--part I: test facility and measurement of site parameters.
IEEE Transactions on Power Delivery
29
(3)
, pp. 1231-1239.
10.1109/TPWRD.2013.2284261
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Clark, David ORCID: https://orcid.org/0000-0002-1090-2361, Griffiths, Huw, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895, Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146 and Guo, Dongsheng
2013.
Wireless measurement system for a large-scale grounding electrode test facility.
Presented at: 48th Power Engineering Conference (UPEC),
Dublin, Ireland,
2-5 Sept 2013.
Power Engineering Conference (UPEC), 2013 48th International Universities'.
Picastaway, NJ:
IEEE,
pp. 1-4.
10.1109/UPEC.2013.6714998
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Guo, Dongsheng, Lathi, Deepak, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895, Griffiths, Huw, Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146 and Ainsley, A.
2010.
Experimental investigation into the performance of large-scale earthing electrodes.
Presented at: 2010 International Conference on High Voltage Engineering and Application (ICHVE),
New Orleans, LA, USA,
11-14 October 2010.
Proceedings of the 2010 International Conference on High Voltage Engineering and Application (ICHVE).
Los Alamitos, CA:
IEEE,
pp. 465-468.
10.1109/ICHVE.2010.5640727
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