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Number of items: 5.

Alhazmi, Mohammed, Albano, Maurizio ORCID: https://orcid.org/0000-0002-5486-4299, James, Jonathan, Justo de Araujo, Anderson Ricardo, Kherif, Omar and Haddad, Abderrahmane 2025. Impact of GIS configuration and trapped charge effects on very fast transient overvoltage in 400 kV systems using ATP-EMTP. Presented at: UPEC 2024, Cardiff, Wales, 02-06 September 2024. Proceedings 59th International Universities Power Engineering Conference (UPEC). IEEE, 10.1109/upec61344.2024.10892408

Alhazmi, Mohammed ORCID: https://orcid.org/0000-0001-7752-4361, Albano, Maurizio ORCID: https://orcid.org/0000-0002-5486-4299, James, Jonathan and Haddad, Abderrahmane Manu ORCID: https://orcid.org/0000-0003-4153-6146 2023. Analysis of trapped charge effects on very fast transient overvoltages in 400 kV gas insulated substations: modelling, simulation, and implications for design and operation. Presented at: 58th International Universities Power Engineering Conference (UPEC), Dublin, Ireland, 30 August - 1 September 2023. Proceedings of 58th International Universities Power Engineering Conference. IEEE, pp. 1-4. 10.1109/UPEC57427.2023.10294391

James, Jonathan Colin 2022. Investigation of transient and safety issues in gas insulated systems. PhD Thesis, Cardiff University.
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James, Jonathan, Albano, Maurizio ORCID: https://orcid.org/0000-0002-5486-4299, Clark, David ORCID: https://orcid.org/0000-0002-1090-2361, Guo, Dongsheng and Haddad, Abderrahmane (Manu) ORCID: https://orcid.org/0000-0003-4153-6146 2020. Analysis of very fast transients using black box macromodels in ATP-EMTP. Energies 13 (3) , 698. 10.3390/en13030698
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James, J., Albano, M. ORCID: https://orcid.org/0000-0002-5486-4299, Haddad, A. ORCID: https://orcid.org/0000-0003-4153-6146 and Guo, D. 2018. Application of multiple modelling techniques for analysis of very fast transient overvoltages in GIS. Presented at: IEEE International Conference on High Voltage Engineering and Application (ICHVE), Athens, Greece, 10-13 Sept 2018. 2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE). IEEE, 10.1109/ICHVE.2018.8642189

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