Elgaid, Khaled ORCID: https://orcid.org/0000-0003-3265-1097, Li, Xu, Williamson, F., McLelland, H., Ferguson, S.M., Holland, M.C., Beaumont, S.P. and Thayne, I.G. 1999. Optimisation of DC and RF performance of GaAs HEMT-based Schottky diodes. Electronics letters 35 (19) , pp. 1678-1679. 10.1049/el:19991104 |
Official URL: http://dx.doi.org/10.1049/el:19991104
Abstract
The authors show that in a GaAs HEMT-based monolithic millimetre-wave integrated circuit process flow, prior to gate metallisation the introduction of a hydrofluoric acid cleaning process after gate recess etching results in a significant reduction in the Schottky diode turn-on voltage, series resistance and bias dependent RF junction resistance
Item Type: | Article |
---|---|
Date Type: | Publication |
Status: | Published |
Schools: | Engineering |
Publisher: | Institution of Engineering & Technology |
ISSN: | 0013-5194 |
Last Modified: | 23 Oct 2022 13:03 |
URI: | https://orca.cardiff.ac.uk/id/eprint/109550 |
Citation Data
Cited 2 times in Scopus. View in Scopus. Powered By Scopus® Data
Actions (repository staff only)
Edit Item |