Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Yankovich, A.B., Zhang, C., Oh, A., Slater, T.J.A. ORCID: https://orcid.org/0000-0003-0372-1551, Azough, F., Freer, R., Haigh, S.J., Willett, R. and Voyles, P.M. 2016. Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology 27 (36) , 364001. 10.1088/0957-4484/27/36/364001

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Abstract

Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Chemistry
Publisher:	IOP Publishing
ISSN:	0957-4484
Last Modified:	10 Nov 2022 10:33
URI:	https://orca.cardiff.ac.uk/id/eprint/147217

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