Yankovich, A.B., Zhang, C., Oh, A., Slater, T.J.A.  ORCID: https://orcid.org/0000-0003-0372-1551, Azough, F., Freer, R., Haigh, S.J., Willett, R. and Voyles, P.M.
2016.
Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images.
Nanotechnology
27
(36)
, 364001.
10.1088/0957-4484/27/36/364001
|
Abstract
Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.
| Item Type: | Article |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Schools > Chemistry |
| Publisher: | IOP Publishing |
| ISSN: | 0957-4484 |
| Last Modified: | 10 Nov 2022 10:33 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/147217 |
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