Measurement of optical gain and Fermi level separation in semiconductor structures

Thomson, John Duncan, Summers, Huw David, Hulyer, Paul J., Smowton, Peter Michael ORCID: https://orcid.org/0000-0002-9105-4842 and Blood, Peter 2000. Measurement of optical gain and Fermi level separation in semiconductor structures. Presented at: Physics and Simulation of Optoelectronic Devices VIII, San Jose, CA, USA, 24-28 January 2000. Published in: Binder, R. H., Blood, Peter and Osinski, M. eds. Physics and Simulation of Optoelectronic Devices VIII. Proceedings of SPIE (3944) Bellingham, WA: SPIE, pp. 201-208. 10.1117/12.391422

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Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Additional Information:	Proceedings of the conference held in San Jose, CA, USA, 24 January 2000
Publisher:	SPIE
Related URLs:	Publisher
Last Modified:	20 Oct 2022 09:11
URI:	https://orca.cardiff.ac.uk/id/eprint/30923

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