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High-speed device characterization using an active load-pull system and waveform engineering postulator

Carrubba, Vincenzo, Clarke, Alan Leslie, Woodington, Simon P., McGenn, William, Akmal, Muhammad, Almuhaisen, Abdullah, Lees, Jonathan, Cripps, Stephen Charles, Tasker, Paul J. and Benedikt, Johannes 2011. High-speed device characterization using an active load-pull system and waveform engineering postulator. Presented at: 2011 77th ARFTG Microwave Measurement Conference (ARFTG), Baltimore, MD, USA, 10 June 2011. Design and Measurement of Microwave Systems - Proceedings of the 2011 77th ARFTG Microwave Measurement Conference (ARFTG). Los Alamitos, CA: IEEE, 10.1109/ARFTG77.2011.6034553

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This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or `postulate' the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to `guide' the harmonic active load-pull measurement system resulting in a very time-efficient characterization process.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Uncontrolled Keywords: Microwave devices, microwave measurements, parameter estimation, power amplifiers, predictive models
Publisher: IEEE
ISBN: 9781612849591
Last Modified: 11 Apr 2018 17:51

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