High-speed device characterization using an active load-pull system and waveform engineering postulator

Carrubba, Vincenzo, Clarke, Alan Leslie, Woodington, Simon P., McGenn, William, Akmal, Muhammad, Almuhaisen, Abdullah, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Cripps, Stephen Charles ORCID: https://orcid.org/0000-0002-2258-951X, Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 and Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 2011. High-speed device characterization using an active load-pull system and waveform engineering postulator. Presented at: 2011 77th ARFTG Microwave Measurement Conference (ARFTG), Baltimore, MD, USA, 10 June 2011. Design and Measurement of Microwave Systems - Proceedings of the 2011 77th ARFTG Microwave Measurement Conference (ARFTG). Los Alamitos, CA: IEEE, 10.1109/ARFTG77.2011.6034553

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Abstract

This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or `postulate' the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to `guide' the harmonic active load-pull measurement system resulting in a very time-efficient characterization process.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Uncontrolled Keywords:	Microwave devices, microwave measurements, parameter estimation, power amplifiers, predictive models
Publisher:	IEEE
ISBN:	9781612849591
Last Modified:	08 Dec 2022 10:37
URI:	https://orca.cardiff.ac.uk/id/eprint/36181

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