Levermann, A. H., Howes, P .B., Edwards, K. A., Anyele, H. T., Matthai, Clarence, MacDonald, John Emyr  ORCID: https://orcid.org/0000-0001-5504-1692, Feidenhans'l, R., Lottermoser, L., Seehofer, L., Falkenberg, G. and Johnson, R. L.
1996.
The atomic structure of the Si(111) reconstruction.
Applied Surface Science
104-05
, pp. 124-129.
10.1016/S0169-4332(96)00132-8
|
Official URL: http://dx.doi.org/10.1016/S0169-4332(96)00132-8
Abstract
We have studied the atomic structure of the View the MathML source reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(111) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors.
| Item Type: | Article |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Schools > Physics and Astronomy |
| Subjects: | Q Science > QC Physics |
| Publisher: | Elsevier |
| ISSN: | 0169-4332 |
| Last Modified: | 24 Oct 2022 10:48 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/45960 |
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